Journal of Oral Science Research ›› 2022, Vol. 38 ›› Issue (4): 330-334.DOI: 10.13701/j.cnki.kqyxyj.2022.04.008

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Study on Registration Accuracy of Auxiliary Registration Device for Severe Artifact Registration

WU Kaixin1, WEI Luming2, SU Ming1, YUAN Changyong1,2, WANG Penglai1,2*   

  1. 1. School of Stomatology, Xuzhou Medical University, Xuzhou 221004, China;
    2. Affiliated Stomatological Hospital of Xuzhou Medical University, Xuzhou 221002, China
  • Received:2021-10-12 Online:2022-04-28 Published:2022-04-22

Abstract: Objective: To explore the registration accuracy of a universal auxiliary registration device for CBCT and optical scanning before virtual implantation planning under severe artifact condition. Methods: Twenty-two patients with dentition defects requiring guided implant surgery were included in the study. Patients with intraoral metal prosthesis were included in the experimental group, and CBCT and model scan were registered using the auxiliary registration device (n=11). Patients without any metal products in the mouth were included in the control group, and the registration was completed with teeth as the registration reference marks (n=11). After the registration of two groups, the registration deviation was analyzed, and the standard deviation (SD), root mean square value (RMS), and mean deviation (±AVG) of the reference blocks' registration deviation were recorded. Results: The registration deviation SD, RMS, +AVG, and -AVG values of the CBCT reconstructed reference block and the optical scan reference block in the experimental group and the control group were (0.16±0.04) mm, (0.17±0.03) mm, (0.14±0.04) mm, (0.15±0.04) mm and (0.14±0.03) mm, (0.16±0.02) mm, (0.13±0.03) mm, (0.13±0.04) mm, respectively. There was no significant difference between the experimental group and the control group (P>0.05). Conclusion: In the case of severe metallic artifact, the general auxiliary registration device can achieve a high registration accuracy.

Key words: implant guide, image registration, cone beam computed tomography, deviation analysis