半导体激光在伴有釉突的Ⅱ度根分叉病变基础治疗中的效果研究

doi:10.13701/j.cnki.kqyxyj.2024.02.006

口腔医学研究 ›› 2024, Vol. 40 ›› Issue (2): 125-129.DOI: 10.13701/j.cnki.kqyxyj.2024.02.006

半导体激光在伴有釉突的Ⅱ度根分叉病变基础治疗中的效果研究

郭小斌^1,2, 文昶¹, 李四红¹, 王水凝¹, 杨栋^1,3*

1.口颌系统重建与再生全国重点实验室,口腔生物医学教育部重点实验室,口腔医学湖北省重点实验室,武汉大学口腔医(学)院湖北武汉 430079;
2.武汉大学口腔医院赵家条门诊部湖北武汉 430079;
3.武汉大学口腔医院牙周科湖北武汉 430079

收稿日期:2023-10-09 出版日期:2024-02-28 发布日期:2024-02-26
通讯作者: *杨栋,E-mail:ydnba@whu.edu.cn
作者简介:郭小斌(1989~ ),女,山东德州人,硕士,主治医师,研究方向:牙周炎的病因学。
基金资助:
湖北省自然科学基金面上项目(编号:2021CFB466) 武汉市医学骨干人才培养工程(编号:2020-55) 武汉大学临床护理专项基金(编号:030) 湖北省高等学校省级教学研究项目(编号:2020044)

Effects of Diode Laser on Periodontal Initial Treatment of Class Ⅱ Furcation Involvement with Enamel Projection

GUO Xiaobin^1,2, WEN Chang¹, LI Sihong¹, WANG Shuining¹, YANG Dong^1,3*

1. State Key Laboratory of Oral & Maxillofacial Reconstruction and Regeneration, Key Laboratory of Oral Biomedicine Ministry of Education, Hubei Key Laboratory of Stomatology, School & Hospital of Stomatology, Wuhan University, Wuhan 430079, China;
2. Department of ZHAO Jiatiao Outpatient Center, School and Hospital of Stomatology, Wuhan University, Wuhan 430079, China;
3. Department of Periodontology, School and Hospital of Stomatology, Wuhan University, Wuhan 430079, China

Received:2023-10-09 Online:2024-02-28 Published:2024-02-26

摘要/Abstract

摘要： 目的:研究半导体激光联合去釉突治疗在伴有釉突的Ⅱ度根分叉病变治疗中的临床效果及其影响因素。方法:纳入存在Ⅱ型釉突的Ⅱ度根分叉病变患者24例,共48颗患牙,随机分为根面平整组(SRP组)、去釉突+SRP组(D+SRP组)、去釉突+SRP+半导体激光组(D+SRP+L组)。SRP组不去釉突直接行SRP;D+SRP组去除釉突后行SRP;D+SRP+L组去釉突后,联合使用半导体激光辅助SRP。分别于治疗前及治疗后4周、3个月比较3组患者的探诊深度(PD)、牙龈出血指数(BI)、牙龈退缩(GR)和附着丧失(CAL)。收集36颗存在Ⅱ型釉突的离体牙,随机分为以上3组,制备根片,原子力显微镜下观察3组的表面形态,测定表面粗糙度(Ra值);免疫荧光细胞迁移实验观察牙周膜成纤维细胞(hPDLFs)迁移能力;牙龈卟啉单胞菌培养观察菌落形态。结果:治疗后4周及3个月,牙周各指标改善情况,D+SRP+L组最显著,D+SRP组次之,SRP组最差(P＜0.01)。原子力显微镜下测定各组表面粗糙度:D+SRP+L组最大,D+SRP组次之,SRP组最小。荧光显微镜下观察hPDLFs迁移细胞数目,D+SRP+L组迁移能力最高,组间差异具有统计学意义(P＜0.01)。原子力显微镜下VPM(peak material volume)值,D+SRP组与SRP组相比无明显差异;而D+SRP+L组最低,与SRP组相比差异有统计学意义。3组菌层厚度无明显差异(P>0.05)。结论:半导体激光联合去釉突可以提高有釉突的Ⅱ度根分叉病变患牙的基础治疗效果。

关键词: 釉突, 半导体激光, 慢性牙周炎, 牙周基础治疗

Abstract: Objective: To study the clinical effect of deglazing combined with diode laser on the treatment of class Ⅱ root furcation involvement. Methods: Forty-eight teeth with grade Ⅱ enamel projections which had root furcation involvement were randomly divided into SRP group, deglazing combined SRP group (D+SRP group), and deglazing combined SRP and diode laser group (D+SRP+L group). The periodontal probing depth (PD), gingival bleeding index (BI), gingival recession (GR), and clinical attachment loss (CAL) in three groups at baseline and four weeks and three months after treatment were compared. At the same time, thirty-six isolated teeth with grade Ⅱ cervical enamel projections were collected and randomly divided into three groups, which were given the same treatment mentioned above. Root slices were prepared. The surface morphology and surface roughness (Ra) were observed under atomic force microscope. Immunofluorescent cells scratch was used to observe the migration of periodontal membrane fibroblasts (hPDLFs). Dental colony morphology was observed by porphyromonas gingivalis culture. Results: Four weeks and three months after treatment, the most significant improvement was found in the D+SRP+L group, followed by D+SRP group and the worst was in the SRP group (P<0.01). Atomic force microscope showed that the largest Ra value was found in D+SRP+L group, followed by the D+SRP group, and the smallest in SRP group (P<0.01). Cell migration ratio of hPDLFs showed the highest migration ability was in the D+SRP+L group, followed by D+SRP group, and the lowest was in the SRP group. The difference between groups was statistically significant (P<0.01). For VPM (peak material volume) value under AFM, there was significant difference between D+SRP+L group and SRP group. But there was no significant difference between D+SRP group and SRP group. There was no significant difference in the germ layer thickness among three groups (P>0.05). Conclusion: Deglazing combined with diode laser can improve the effect of initial treatment of root furcation involvement.

Key words: enamel projection, diode laser, chronic periodontitis, periodontal initial therapy

郭小斌, 文昶, 李四红, 王水凝, 杨栋. 半导体激光在伴有釉突的Ⅱ度根分叉病变基础治疗中的效果研究[J]. 口腔医学研究, 2024, 40(2): 125-129.

GUO Xiaobin, WEN Chang, LI Sihong, WANG Shuining, YANG Dong. Effects of Diode Laser on Periodontal Initial Treatment of Class Ⅱ Furcation Involvement with Enamel Projection[J]. Journal of Oral Science Research, 2024, 40(2): 125-129.

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半导体激光在伴有釉突的Ⅱ度根分叉病变基础治疗中的效果研究

Effects of Diode Laser on Periodontal Initial Treatment of Class Ⅱ Furcation Involvement with Enamel Projection

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